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Depth direction analysis device - List of Manufacturers, Suppliers, Companies and Products

Depth direction analysis device Product List

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[Analysis Case] Depth Direction Analysis of Thin Carbon Films

[Analysis Case] Depth Direction Analysis of Thin Carbon Films

Depth-direction analysis of diamond-like carbon (DLC) and graphene is possible.

TOF-SIMS allows for the acquisition of mass spectra in the depth direction, enabling the analysis of components in very thin layers through qualitative assessment of each layer. In this case, we analyzed a hard disk in the depth direction. As a result, it was found that the diamond-like carbon (DLC) layer formed on the surface has a two-layer structure, with a nitrogen-containing C layer on the surface side and a layer consisting solely of C on the deeper side. This method can also be applied to the depth analysis of graphene films. Measurement method: TOF-SIMS Product fields: Electronic components, manufacturing equipment, parts Analysis objectives: Composition evaluation, identification, composition distribution evaluation For more details, please download the materials or contact us.

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[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS

[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS

Evaluate organic EL elements with good depth direction resolution.

To extend the lifespan of organic EL devices, it is essential to evaluate the degradation caused by electromigration, making it important to investigate the diffusion state of electrode metal components into the organic layer. However, whether analyzed directly from the cathode side or through the SSDP method from the anode side, the depth resolution decreases, making it difficult to assess the diffusion from the interface into the organic layer. (Note: SSDP method refers to analysis from the backside. For details on the analytical method, see section B0013.) Therefore, by using special processing to expose the cathode/organic layer interface and the organic layer/anode interface, it has become possible to evaluate the organic layer with high depth resolution.

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Evaluation of the printed layer on the metal surface

Evaluation of the printed layer on the metal surface

Conduct cross-sectional structural analysis and depth-direction analysis using TOF-SIMS! It is possible to confirm the distribution of components from the surface coating layer to the metal and the coloring components.

As an evaluation of the quality of the printed layer on the metal surface, the bonding state with the metal and the dispersion state of the coloring components can be observed through cross-sectional processing. Additionally, by conducting depth-direction analysis using TOF-SIMS with GCIB from the surface, the distribution of components from the surface coating layer to the metal and the coloring components can be confirmed. Please feel free to contact us when needed. 【GCIB Features】 ■ The energy per ion beam atom is low, making it suitable for depth-direction analysis of organic films and others. ■ High mass number fragments that reflect the molecular structure information of the film can be detected. *For more details, please download the PDF or feel free to contact us.

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